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NANO SCALE THERMAL CONDUCTIVITY CONTRAST MEASUREMENTS OF BENNU SAMPLE OREX-800055-9 USING AN ATOMIC FORCE MICROSCOPE

Author

James Freemantle



Description

An Atomic Force Microscope (Park NX10) has been used to measure surface height (Z) and thermal conductivity variations of a sample OREX-800055-9. Images are created using Conductivity Contrast Mode. Measured forward current is proportional to sample thermal conductivity. These images are our first look at the sample and therefor may not have been collected under optimal conditions. Latter images may have different collection parameters.


Info

Mission
OSIRIS-REx
Sample
OREX-800055-9
Session
20250116_STHM-AFM_YU_OREX-800055-9_1

Analytical Methods

Laboratory
York University
Instrument
Park Systems NX10 AFM
Technique
Scanning Thermal Microscopy with AFM

How To Cite

Freemantle, J., 2025. NANO SCALE THERMAL CONDUCTIVITY CONTRAST MEASUREMENTS OF BENNU SAMPLE OREX-800055-9 USING AN ATOMIC FORCE MICROSCOPE, Version 1.0. Astromaterials Data Archive. https://doi.org/10.60707/q1s1-n845 Accessed 2025-06-17.

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Type

Dataset

Date Created

May 12, 2025

Size

8.05 MB

License
Review Status

Pending External Review


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Funding Sources

This material is supported by NASA under contract NNM10AA11C issued through the New Frontiers program. Additional funding provided by the Canadian Space Agency to support researchers Daly, Freemantle and Wilson.

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